Electron and Ion Beam Characterization
Electron and ion beams are widely used for both qualitative and quantitative analysis of semiconductor materials and devices. They can be used to image...
About This Course
Electron and ion beams are widely used for both qualitative and quantitative analysis of semiconductor materials and devices. They can be used to image structures with sub-nm resolution and to provide information about elemental composition and dopant concentration. This course describes the fundamentals of electron and ion beam characterization and includes a project that analyzes the surface roughness of a solar cell.
Frequently Asked Questions
How much does Electron and Ion Beam Characterization cost?
Electron and Ion Beam Characterization costs $49. Check the course page for current pricing and available discounts.
Who teaches Electron and Ion Beam Characterization?
Electron and Ion Beam Characterization is taught by Arizona State University, Arizona State University.
What skill level is Electron and Ion Beam Characterization for?
This course is designed for beginner learners.
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